A method for measuring the thickness of thin bent foils in transmission electron microscopy

Pierre Delavignette; R.W. Vook

A method for measuring the thickness of thin bent foils in transmission electron microscopy

Pierre Delavignette, R.W. Vook

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Abstract

A new method for measuring the thickness of thin monocrystalline foils in the range of 1000 A is presented. This method is based on the observation of KosseI-MöIIenstedt fringes in transmission electron microscopy. It differs from the classical Kossel-MöIIenstedt method in electron diffraction by the fact that no divergent beam is needed. However, the foil should be bent and the method is based on the measurement of this radius of curvature

Original language	English
Publisher	SCK CEN
Number of pages	10
State	Published - Jan 1963

Publication series

Name	SCK•CEN Reports
Publisher	Studiecentrum voor Kernenergie
No.	BLG-178

Access to Document

BLG-178Final published version, 5.05 MBLicense: Unspecified

Cite this

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abstract = "A new method for measuring the thickness of thin monocrystalline foils in the range of 1000 A is presented. This method is based on the observation of KosseI-M{\"o}IIenstedt fringes in transmission electron microscopy. It differs from the classical Kossel-M{\"o}IIenstedt method in electron diffraction by the fact that no divergent beam is needed. However, the foil should be bent and the method is based on the measurement of this radius of curvature",

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