A method for measuring the thickness of thin bent foils in transmission electron microscopy

Pierre Delavignette, R.W. Vook

    Research outputpeer-review

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    Abstract

    A new method for measuring the thickness of thin monocrystalline foils in the range of 1000 A is presented. This method is based on the observation of KosseI-MöIIenstedt fringes in transmission electron microscopy. It differs from the classical Kossel-MöIIenstedt method in electron diffraction by the fact that no divergent beam is needed. However, the foil should be bent and the method is based on the measurement of this radius of curvature
    Original languageEnglish
    PublisherSCK CEN
    Number of pages10
    StatePublished - Jan 1963

    Publication series

    NameSCK•CEN Reports
    PublisherStudiecentrum voor Kernenergie
    No.BLG-178

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