TY - JOUR
T1 - A set of X-ray fluorescence reference sources for the intrinsic efficiency calibration of Si(Li) detectors down to 1 keV
AU - Denecke, B.
AU - Bambynek, Walter
AU - Grosse, G.
AU - Wätjen, Uwe
AU - Ballaux, C.
PY - 1990/4/2
Y1 - 1990/4/2
N2 - X-ray fluorescence sources were prepared and their emission rates certified with an accuracy of better than 2%. The sources were standardized using a gas-flow proportional counter in a defined low-solid-angle setup. They were used for the efficiency calibration of a Si(Li) detector at the characteristic K X-ray energies of Al, P, S, Cl, Ca and Ti.
AB - X-ray fluorescence sources were prepared and their emission rates certified with an accuracy of better than 2%. The sources were standardized using a gas-flow proportional counter in a defined low-solid-angle setup. They were used for the efficiency calibration of a Si(Li) detector at the characteristic K X-ray energies of Al, P, S, Cl, Ca and Ti.
UR - http://www.scopus.com/inward/record.url?scp=38249019160&partnerID=8YFLogxK
U2 - 10.1016/0168-583X(90)90233-K
DO - 10.1016/0168-583X(90)90233-K
M3 - Article
AN - SCOPUS:38249019160
SN - 0168-583X
VL - 49
SP - 152
EP - 156
JO - Nuclear Inst. and Methods in Physics Research, B
JF - Nuclear Inst. and Methods in Physics Research, B
IS - 1-4
ER -