Accurate Characterization of Subgrain Boundaries in a TEM

E. K. Polychroniadis; P. Delavignette

doi:10.1002/pssa.2210770134

Accurate Characterization of Subgrain Boundaries in a TEM

E. K. Polychroniadis, P. Delavignette

Research output › peer-review

Abstract

A method is presented allowing a high precision in the determination of all the elements characterizing a subgrain boundary. These elementes are: the rotation axis and its small angle, the boundary plane, the directions of the dislocation lines, the equidistances of the different dislocation families. These informations allow the determination of the length of Burgers vectors of the boundary dislocations. The precision of the method is controlled by Burgers vectors determinations obtained from their contrast analysis in transmission electron microscopy.

Original language	English
Pages (from-to)	291-308
Number of pages	18
Journal	physica status solidi (a)
Volume	77
Issue number	1
DOIs	https://doi.org/10.1002/pssa.2210770134
State	Published - 16 May 1983
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

Access to Document

10.1002/pssa.2210770134

Cite this

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