Application of the microinterferometric tomography setup to the reliability tests of the fiber sensors exposed to cumulated gamma radiation

Pawel Kniazewski; Malgorzata Kujawinska; Francis Berghmans; Alberto Fernandez; Andrei Goussarov; Marco Van Uffelen

doi:10.1117/12.612932

Application of the microinterferometric tomography setup to the reliability tests of the fiber sensors exposed to cumulated gamma radiation

Pawel Kniazewski, Malgorzata Kujawinska, Francis Berghmans, Alberto Fernandez, Andrei Goussarov, Marco Van Uffelen

Research output › peer-review

Abstract

In this paper we report on the measurement of the refractive index profile of optical fibers exposed to the gamma radiation. The tool we used for determining the refractive index distribution is microinterferometric tomography. Nuclear radiation is known to affect the guiding properties of optical fibers and it is therefore essential to characterize these effects to assess the applicability of fiber-optic technology for communication and sensing in space applications and in nuclear industry. We show that the fibres exhibit a slight refractive index increase which confirms results reported earlier.

Original language	English
Title of host publication	Proceedings of SPIE
Subtitle of host publication	Nano- and Micro-metrology
Place of Publication	United States
Pages	42-49
Number of pages	8
Volume	5858
DOIs	https://doi.org/10.1117/12.612932
State	Published - 2005
Event	2005 - SPIE : Optical Metrology - SPIE, Munich Duration: 13 Jun 2005 → 17 Jun 2005

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Publisher	SPIE - Society of Photo-optical Instrumentation Engineers
ISSN (Print)	0277-786X

Conference

Conference	2005 - SPIE
Country/Territory	Germany
City	Munich
Period	2005-06-13 → 2005-06-17

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Access to Document

10.1117/12.612932License: Unspecified

Cite this

Kniazewski, P., Kujawinska, M., Berghmans, F., Fernandez, A., Goussarov, A., & Van Uffelen, M. (2005). Application of the microinterferometric tomography setup to the reliability tests of the fiber sensors exposed to cumulated gamma radiation. In Proceedings of SPIE: Nano- and Micro-metrology (Vol. 5858, pp. 42-49). Article 585805 (Proceedings of SPIE - The International Society for Optical Engineering).. https://doi.org/10.1117/12.612932

Kniazewski, Pawel ; Kujawinska, Malgorzata ; Berghmans, Francis et al. / Application of the microinterferometric tomography setup to the reliability tests of the fiber sensors exposed to cumulated gamma radiation. Proceedings of SPIE: Nano- and Micro-metrology. Vol. 5858 United States, 2005. pp. 42-49 (Proceedings of SPIE - The International Society for Optical Engineering).

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title = "Application of the microinterferometric tomography setup to the reliability tests of the fiber sensors exposed to cumulated gamma radiation",

abstract = "In this paper we report on the measurement of the refractive index profile of optical fibers exposed to the gamma radiation. The tool we used for determining the refractive index distribution is microinterferometric tomography. Nuclear radiation is known to affect the guiding properties of optical fibers and it is therefore essential to characterize these effects to assess the applicability of fiber-optic technology for communication and sensing in space applications and in nuclear industry. We show that the fibres exhibit a slight refractive index increase which confirms results reported earlier.",

keywords = "3D refractive index distribution, Gamma radiation, Interferometric tomography, Optical fibers",

author = "Pawel Kniazewski and Malgorzata Kujawinska and Francis Berghmans and Alberto Fernandez and Andrei Goussarov and {Van Uffelen}, Marco",

note = "Score = 3; 2005 - SPIE : Optical Metrology ; Conference date: 13-06-2005 Through 17-06-2005",

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doi = "10.1117/12.612932",

language = "English",

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Kniazewski, P, Kujawinska, M, Berghmans, F , Fernandez, A , Goussarov, A & Van Uffelen, M 2005, Application of the microinterferometric tomography setup to the reliability tests of the fiber sensors exposed to cumulated gamma radiation. in Proceedings of SPIE: Nano- and Micro-metrology. vol. 5858, 585805, Proceedings of SPIE - The International Society for Optical Engineering, United States, pp. 42-49, 2005 - SPIE , Munich, Germany, 2005-06-13. https://doi.org/10.1117/12.612932

Application of the microinterferometric tomography setup to the reliability tests of the fiber sensors exposed to cumulated gamma radiation. / Kniazewski, Pawel; Kujawinska, Malgorzata; Berghmans, Francis et al.
Proceedings of SPIE: Nano- and Micro-metrology. Vol. 5858 United States, 2005. p. 42-49 585805 (Proceedings of SPIE - The International Society for Optical Engineering).

Research output › peer-review

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T1 - Application of the microinterferometric tomography setup to the reliability tests of the fiber sensors exposed to cumulated gamma radiation

AU - Kniazewski, Pawel

AU - Kujawinska, Malgorzata

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AU - Fernandez, Alberto

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AU - Van Uffelen, Marco

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AB - In this paper we report on the measurement of the refractive index profile of optical fibers exposed to the gamma radiation. The tool we used for determining the refractive index distribution is microinterferometric tomography. Nuclear radiation is known to affect the guiding properties of optical fibers and it is therefore essential to characterize these effects to assess the applicability of fiber-optic technology for communication and sensing in space applications and in nuclear industry. We show that the fibres exhibit a slight refractive index increase which confirms results reported earlier.

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Kniazewski P, Kujawinska M, Berghmans F , Fernandez A , Goussarov A , Van Uffelen M. Application of the microinterferometric tomography setup to the reliability tests of the fiber sensors exposed to cumulated gamma radiation. In Proceedings of SPIE: Nano- and Micro-metrology. Vol. 5858. United States. 2005. p. 42-49. 585805. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.612932