Comparison of simulated and experimental results for distributed radiation-induced absorption measurement using OFDR reflectometry

A. V. Faustov, A. Gusarov, L. B. Liokumovich, A. A. Fotiadi, M. Wuilpart, P. Mégret

    Research outputpeer-review


    In this paper we present results of computer simulation of the Optical Frequency Domain Reflectometry system used for measuring distributed radiation-induced absorption. We simulated conditions of an experiment in which a highly radiation sensitive optical fibre doped with aluminium was exposed to gamma-radiation. The total exposed dose was about 50 kGy. We measured two backscattering profiles of the fibre network before and right after irradiation to estimate the induced change of the trace slope which in case of optical fibre dosimetry is used for total dose estimation. Then we simulated this experiment using a MATLAB model imitating an optical fibre backscattering profile. The simulation was based on the operational principles of the OFDR system and imitated its measurement algorithm. As a result of simulation we obtained two backscattering traces which were in good conformity with those measured in the real-life experiment. To our knowledge, this is the first time that distributed measurement of radiation-induced absorption using optical frequency domain reflectometry has been simulated.

    Original languageEnglish
    Title of host publicationFifth European Workshop on Optical Fibre Sensors
    PublisherSPIE - Society of Photo-optical Instrumentation Engineers
    Number of pages6
    ISBN (Print)9780819496348
    StatePublished - 20 May 2013
    Event2013 - EWOFS: 5th European Workshop on Optical Fibre Sensors - Krakow
    Duration: 19 May 201322 May 2013

    Publication series

    NameProceedings of SPIE - The International Society for Optical Engineering
    ISSN (Print)0277-786X
    ISSN (Electronic)1996-756X


    Conference2013 - EWOFS

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics
    • Computer Science Applications
    • Applied Mathematics
    • Electrical and Electronic Engineering

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