Contrast effects at dislocation networks in very thin polyethylene single crystals observed in the electron microscope

V.F. Holland, P.H. Lindenmeyer, R. Trivedi, Severin Amelinckx

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    The contrast effects at dislocations in very thin bi-layered single crystals of polyethylene are discussed on the basis of the dynamical theory. The crystal thickness is smaller than one extinction distance. In such crystals the dislocation lines can be imaged either as bright or as dark lines in both the bright and the dark field image. In one area of the bright field image one family of dislocations may be observed as bright lines and another family as dark lines. Image "inversion” takes place in the bent contours, i.e., dark lines become bright and vice versa. The dark field images due to the diffraction vectors +g and -g may be either similar or complementary.
    All these observations can be accounted for by comparing them with profiles computed on the basis of the dynamical theory.
    Original languageEnglish
    PublisherSCK CEN
    Number of pages33
    StatePublished - May 1965

    Publication series

    NameSCK CEN Reports
    PublisherSCK CEN

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