TY - GEN
T1 - Crack resistance determination from the charpy impact test
AU - Chaouadi, R.
PY - 2006
Y1 - 2006
N2 - Many engineers and scientists investigated the possibility to correlate Charpy impact energy with the fracture toughness. As a result, many empirical correlations can be found in literature [1–2]. However, most of these correlations had a limited application range due primarily to their empirical basis. Recently, a simple procedure was provided to determine crack length from the load-displacement test record [3]. The basic idea is that crack length is proportional to the absorbed energy, namely: ∆ai ∞(Ei - E0/Efinal - E0)2 ((1)) where “Ei” is the absorbed energy at time “i”, E0 is a threshold energy corresponding to onset of crack extension and Efinal is the final energy corresponding to a measured crack extension Δafinal.
AB - Many engineers and scientists investigated the possibility to correlate Charpy impact energy with the fracture toughness. As a result, many empirical correlations can be found in literature [1–2]. However, most of these correlations had a limited application range due primarily to their empirical basis. Recently, a simple procedure was provided to determine crack length from the load-displacement test record [3]. The basic idea is that crack length is proportional to the absorbed energy, namely: ∆ai ∞(Ei - E0/Efinal - E0)2 ((1)) where “Ei” is the absorbed energy at time “i”, E0 is a threshold energy corresponding to onset of crack extension and Efinal is the final energy corresponding to a measured crack extension Δafinal.
KW - Charpy impact test
KW - Crack resistance curve
UR - http://www.scopus.com/inward/record.url?scp=84908296624&partnerID=8YFLogxK
U2 - 10.1007/1-4020-4972-2_255
DO - 10.1007/1-4020-4972-2_255
M3 - In-proceedings paper
AN - SCOPUS:84908296624
T3 - Fracture of Nano and Engineering Materials and Structures - Proceedings of the 16th European Conference of Fracture
SP - 515
EP - 516
BT - Fracture of Nano and Engineering Materials and Structures
A2 - Gdoutos, E.E.
PB - Kluwer Academic Publishers
T2 - 2006 - ECF
Y2 - 3 July 2006 through 7 July 2006
ER -