Design and assessment of a circuit and layout level radiation hardened CMOS VCSEL driver

Paul Leroux; Steven Lens; Reinhard Voorspoels; Marco Van Uffelen; Wouter De Cock; Michiel Steyaert; Francis Berghmans

doi:10.1109/TNS.2007.901195

Design and assessment of a circuit and layout level radiation hardened CMOS VCSEL driver

Paul Leroux, Steven Lens, Reinhard Voorspoels, Marco Van Uffelen, Wouter De Cock, Michiel Steyaert, Francis Berghmans

Research output › peer-review

Abstract

The radiation hard design of a 155 Mb/s, 0.7 μm CMOS driver for a vertical-cavity surface-emitting laser (VCSEL) is presented. The circuit features enhanced tolerance to radia-tion induced shifts in the device characteristics by employing a replica-based feedback mechanism. The layout was achieved using an in-house developed radiation hardened component library. At a low dose rate of 4.5 Gy/h or 450 rad/h, the output current remains constant up to at least 3.5 kGy. At a dose rate of 21 kGy/h, the output current of the driver drops by 10% at a dose of 3.5 MGy and breaks down completely at 5.5 MGy.

Original language	English
Pages (from-to)	1055-1060
Number of pages	6
Journal	IEEE transactions on nuclear Science
Volume	54
Issue number	4
DOIs	https://doi.org/10.1109/TNS.2007.901195
State	Published - Aug 2007

ASJC Scopus subject areas

Nuclear and High Energy Physics
Nuclear Energy and Engineering
Electrical and Electronic Engineering

Access to Document

10.1109/TNS.2007.901195License: Unspecified

Cite this

@article{01c1b73793874cd4b74c8357e766a285,

title = "Design and assessment of a circuit and layout level radiation hardened CMOS VCSEL driver",

abstract = "The radiation hard design of a 155 Mb/s, 0.7 μm CMOS driver for a vertical-cavity surface-emitting laser (VCSEL) is presented. The circuit features enhanced tolerance to radia-tion induced shifts in the device characteristics by employing a replica-based feedback mechanism. The layout was achieved using an in-house developed radiation hardened component library. At a low dose rate of 4.5 Gy/h or 450 rad/h, the output current remains constant up to at least 3.5 kGy. At a dose rate of 21 kGy/h, the output current of the driver drops by 10% at a dose of 3.5 MGy and breaks down completely at 5.5 MGy.",

keywords = "CMOS, Laser driver, Optical transmitter, Radiation hardening, Total ionizing dose (TID), Vertical-cavity surface-emitting laser (VCSEL)",

author = "Paul Leroux and Steven Lens and Reinhard Voorspoels and {Van Uffelen}, Marco and {De Cock}, Wouter and Michiel Steyaert and Francis Berghmans",

year = "2007",

month = aug,

doi = "10.1109/TNS.2007.901195",

language = "English",

volume = "54",

pages = "1055--1060",

journal = "IEEE transactions on nuclear Science",

issn = "0018-9499",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "4",

}

TY - JOUR

T1 - Design and assessment of a circuit and layout level radiation hardened CMOS VCSEL driver

AU - Leroux, Paul

AU - Lens, Steven

AU - Voorspoels, Reinhard

AU - Van Uffelen, Marco

AU - De Cock, Wouter

AU - Steyaert, Michiel

AU - Berghmans, Francis

PY - 2007/8

Y1 - 2007/8

N2 - The radiation hard design of a 155 Mb/s, 0.7 μm CMOS driver for a vertical-cavity surface-emitting laser (VCSEL) is presented. The circuit features enhanced tolerance to radia-tion induced shifts in the device characteristics by employing a replica-based feedback mechanism. The layout was achieved using an in-house developed radiation hardened component library. At a low dose rate of 4.5 Gy/h or 450 rad/h, the output current remains constant up to at least 3.5 kGy. At a dose rate of 21 kGy/h, the output current of the driver drops by 10% at a dose of 3.5 MGy and breaks down completely at 5.5 MGy.

AB - The radiation hard design of a 155 Mb/s, 0.7 μm CMOS driver for a vertical-cavity surface-emitting laser (VCSEL) is presented. The circuit features enhanced tolerance to radia-tion induced shifts in the device characteristics by employing a replica-based feedback mechanism. The layout was achieved using an in-house developed radiation hardened component library. At a low dose rate of 4.5 Gy/h or 450 rad/h, the output current remains constant up to at least 3.5 kGy. At a dose rate of 21 kGy/h, the output current of the driver drops by 10% at a dose of 3.5 MGy and breaks down completely at 5.5 MGy.

KW - CMOS

KW - Laser driver

KW - Optical transmitter

KW - Radiation hardening

KW - Total ionizing dose (TID)

KW - Vertical-cavity surface-emitting laser (VCSEL)

UR - http://www.scopus.com/inward/record.url?scp=34548081942&partnerID=8YFLogxK

U2 - 10.1109/TNS.2007.901195

DO - 10.1109/TNS.2007.901195

M3 - Article

AN - SCOPUS:34548081942

SN - 0018-9499

VL - 54

SP - 1055

EP - 1060

JO - IEEE transactions on nuclear Science

JF - IEEE transactions on nuclear Science

IS - 4

ER -