Design and assessment of a circuit and layout level radiation hardened CMOS VCSEL driver

Paul Leroux, Steven Lens, Reinhard Voorspoels, Marco Van Uffelen, Wouter De Cock, Michiel Steyaert, Francis Berghmans

    Research outputpeer-review


    The radiation hard design of a 155 Mb/s, 0.7 μm CMOS driver for a vertical-cavity surface-emitting laser (VCSEL) is presented. The circuit features enhanced tolerance to radia-tion induced shifts in the device characteristics by employing a replica-based feedback mechanism. The layout was achieved using an in-house developed radiation hardened component library. At a low dose rate of 4.5 Gy/h or 450 rad/h, the output current remains constant up to at least 3.5 kGy. At a dose rate of 21 kGy/h, the output current of the driver drops by 10% at a dose of 3.5 MGy and breaks down completely at 5.5 MGy.

    Original languageEnglish
    Pages (from-to)1055-1060
    Number of pages6
    JournalIEEE transactions on nuclear Science
    Issue number4
    StatePublished - Aug 2007

    ASJC Scopus subject areas

    • Nuclear and High Energy Physics
    • Nuclear Energy and Engineering
    • Electrical and Electronic Engineering

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