Detection of implanted ions by X‐ray emission analysis in TEM

M. Hou, P. Delavignette, A. Art

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ASJC Scopus subject areas

@article{b96a5552b62c4289bd1a5a19fc1c1275,

title = "Detection of implanted ions by X‐ray emission analysis in TEM",

author = "M. Hou and P. Delavignette and A. Art",

year = "1978",

month = apr,

day = "16",

doi = "10.1002/pssa.2210460261",

language = "English",

volume = "46",

pages = "K167--K169",

journal = "physica status solidi (a)",

issn = "0031-8965",

publisher = "Wiley - John Wiley \& Sons, Ltd",

number = "2",

}

TY - JOUR

T1 - Detection of implanted ions by X‐ray emission analysis in TEM

AU - Hou, M.

AU - Delavignette, P.

AU - Art, A.

PY - 1978/4/16

Y1 - 1978/4/16

UR - https://www.scopus.com/pages/publications/84987068020

U2 - 10.1002/pssa.2210460261

DO - 10.1002/pssa.2210460261

M3 - Article

AN - SCOPUS:84987068020

SN - 0031-8965

VL - 46

SP - K167-K169

JO - physica status solidi (a)

JF - physica status solidi (a)

IS - 2

ER -