Detection of implanted ions by X‐ray emission analysis in TEM

Research output › peer-review

Original language	English
Pages (from-to)	K167-K169
Journal	Physica Status Solidi (A) Applied Research
Volume	46
Issue number	2
DOIs	https://doi.org/10.1002/pssa.2210460261
State	Published - 16 Apr 1978

ASJC Scopus subject areas

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title = "Detection of implanted ions by X‐ray emission analysis in TEM",

author = "M. Hou and P. Delavignette and A. Art",

year = "1978",

month = apr,

day = "16",

doi = "10.1002/pssa.2210460261",

language = "English",

volume = "46",

pages = "K167--K169",

journal = "Physica Status Solidi (A) Applied Research",

issn = "0031-8965",

publisher = "Wiley-VCH Verlag",

number = "2",

}

TY - JOUR

T1 - Detection of implanted ions by X‐ray emission analysis in TEM

AU - Hou, M.

AU - Delavignette, P.

AU - Art, A.

PY - 1978/4/16

Y1 - 1978/4/16

UR - https://www.scopus.com/pages/publications/84987068020

U2 - 10.1002/pssa.2210460261

DO - 10.1002/pssa.2210460261

M3 - Article

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JO - Physica Status Solidi (A) Applied Research

JF - Physica Status Solidi (A) Applied Research

IS - 2

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