Determination of some instrumental constants of the electron microscope Philips EM 200

Pierre Delavignette

    Research outputpeer-review

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    A method of measurement of Image rotation at different magnifications
    as well as the rotation of the diffraction pattern is described.
    A method of calibration of the magnification and of the diffraction
    pattern is also presented.
    Original languageEnglish
    PublisherSCK CEN
    Number of pages5
    StatePublished - May 1963

    Publication series

    NameSCK CEN Reports
    PublisherSCK CEN

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