Determination of some instrumental constants of the electron microscope Philips EM 200

Pierre Delavignette

Determination of some instrumental constants of the electron microscope Philips EM 200

Pierre Delavignette

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Abstract

A method of measurement of Image rotation at different magnifications
as well as the rotation of the diffraction pattern is described.
A method of calibration of the magnification and of the diffraction
pattern is also presented.

Original language	English
Publisher	SCK CEN
Number of pages	5
State	Published - May 1963

Publication series

Name	SCK CEN Reports
Publisher	SCK CEN
No.	BLG-226

Cite this

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abstract = "A method of measurement of Image rotation at different magnificationsas well as the rotation of the diffraction pattern is described.A method of calibration of the magnification and of the diffractionpattern is also presented.",

author = "Pierre Delavignette",

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month = may,

language = "English",

series = "SCK CEN Reports",

publisher = "SCK CEN",

number = "BLG-226",

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AB - A method of measurement of Image rotation at different magnificationsas well as the rotation of the diffraction pattern is described.A method of calibration of the magnification and of the diffractionpattern is also presented.

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BT - Determination of some instrumental constants of the electron microscope Philips EM 200

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