Determination of some instrumental constants of the electron microscope Philips EM 200

P. Delavignette

doi:10.1088/0950-7671/40/9/413

Determination of some instrumental constants of the electron microscope Philips EM 200

P. Delavignette

Research output › peer-review

Abstract

A method of measurement of image rotation at different magnifications as well as the rotation of the diffraction pattern is described. A method of calibration of the magnification and of the diffraction pattern is also presented.

Original language	English
Article number	413
Pages (from-to)	461-462
Number of pages	2
Journal	Journal of Scientific Instruments
Volume	40
Issue number	9
DOIs	https://doi.org/10.1088/0950-7671/40/9/413
State	Published - 1963

ASJC Scopus subject areas

General Medicine

Access to Document

10.1088/0950-7671/40/9/413

Cite this

@article{162e805a653b46a5b8f7029a4f70a633,

title = "Determination of some instrumental constants of the electron microscope Philips EM 200",

abstract = "A method of measurement of image rotation at different magnifications as well as the rotation of the diffraction pattern is described. A method of calibration of the magnification and of the diffraction pattern is also presented.",

author = "P. Delavignette",

year = "1963",

doi = "10.1088/0950-7671/40/9/413",

language = "English",

volume = "40",

pages = "461--462",

journal = "Journal of Scientific Instruments",

issn = "0950-7671",

publisher = "Institute of Physics and the Physical Society",

number = "9",

}

TY - JOUR

T1 - Determination of some instrumental constants of the electron microscope Philips EM 200

AU - Delavignette, P.

PY - 1963

Y1 - 1963

N2 - A method of measurement of image rotation at different magnifications as well as the rotation of the diffraction pattern is described. A method of calibration of the magnification and of the diffraction pattern is also presented.

AB - A method of measurement of image rotation at different magnifications as well as the rotation of the diffraction pattern is described. A method of calibration of the magnification and of the diffraction pattern is also presented.

UR - http://www.scopus.com/inward/record.url?scp=36149060711&partnerID=8YFLogxK

U2 - 10.1088/0950-7671/40/9/413

DO - 10.1088/0950-7671/40/9/413

M3 - Article

AN - SCOPUS:36149060711

SN - 0950-7671

VL - 40

SP - 461

EP - 462

JO - Journal of Scientific Instruments

JF - Journal of Scientific Instruments

IS - 9

M1 - 413

ER -