Determination of some instrumental constants of the electron microscope Philips EM 200

P. Delavignette

doi:10.1088/0950-7671/40/9/413

Determination of some instrumental constants of the electron microscope Philips EM 200

P. Delavignette

Research output › peer-review

Abstract

A method of measurement of image rotation at different magnifications as well as the rotation of the diffraction pattern is described. A method of calibration of the magnification and of the diffraction pattern is also presented.

Original language	English
Article number	413
Pages (from-to)	461-462
Number of pages	2
Journal	Journal of Scientific Instruments
Volume	40
Issue number	9
DOIs	https://doi.org/10.1088/0950-7671/40/9/413
State	Published - 1963

ASJC Scopus subject areas

General Medicine

Access to Document

10.1088/0950-7671/40/9/413

Cite this

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title = "Determination of some instrumental constants of the electron microscope Philips EM 200",

abstract = "A method of measurement of image rotation at different magnifications as well as the rotation of the diffraction pattern is described. A method of calibration of the magnification and of the diffraction pattern is also presented.",

author = "P. Delavignette",

year = "1963",

doi = "10.1088/0950-7671/40/9/413",

language = "English",

volume = "40",

pages = "461--462",

journal = "Journal of Scientific Instruments",

issn = "0950-7671",

publisher = "Institute of Physics",

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PY - 1963

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AB - A method of measurement of image rotation at different magnifications as well as the rotation of the diffraction pattern is described. A method of calibration of the magnification and of the diffraction pattern is also presented.

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VL - 40

SP - 461

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JO - Journal of Scientific Instruments

JF - Journal of Scientific Instruments

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