Determination of some instrumental constants of the electron microscope Philips EM 200

Pierre Delavignette

Determination of some instrumental constants of the electron microscope Philips EM 200

Pierre Delavignette

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Abstract

A method of measurement of Image rotation at different magnifications
as well as the rotation of the diffraction pattern is described.
A method of calibration of the magnification and of the diffraction
pattern is also presented.

Original language	English
Publisher	SCK CEN
Number of pages	5
State	Published - May 1963

Publication series

Name	SCK CEN Reports
Publisher	SCK CEN
No.	BLG-226

Cite this

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abstract = "A method of measurement of Image rotation at different magnifications as well as the rotation of the diffraction pattern is described. A method of calibration of the magnification and of the diffraction pattern is also presented.",

author = "Pierre Delavignette",

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month = may,

language = "English",

series = "SCK CEN Reports",

publisher = "SCK CEN",

number = "BLG-226",

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AB - A method of measurement of Image rotation at different magnifications as well as the rotation of the diffraction pattern is described. A method of calibration of the magnification and of the diffraction pattern is also presented.

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BT - Determination of some instrumental constants of the electron microscope Philips EM 200

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