Deterministic analytical method for the calibration of semiconductor detectors in gamma ray spectrometry

J. L. Genicot; F. Hardeman; F. Waetermans

doi:10.1093/oxfordjournals.rpd.a082770

Deterministic analytical method for the calibration of semiconductor detectors in gamma ray spectrometry

J. L. Genicot, F. Hardeman, F. Waetermans

Research output › peer-review

Abstract

A simple to use computer program (called ATT3D) to calculate the detector efficiency for any type of geometry and material is described. The requested data are a point geometry efficiency and the description of the detector's and sample's geometries. This program, adapted for a 486 computer or for a workstation, can be used in different applications and especially in body burden assessment by the direct method (whole-body counting). The accuracy depends on the description of the geometry which can be adapted by changing the mesh size when high precision is requested.

Original language	English
Pages (from-to)	141-144
Number of pages	4
Journal	Radiation protection dosimetry
Volume	61
Issue number	1-3
DOIs	https://doi.org/10.1093/oxfordjournals.rpd.a082770
State	Published - 1995

ASJC Scopus subject areas

Radiological and Ultrasound Technology
Radiation
Radiology Nuclear Medicine and imaging
Public Health, Environmental and Occupational Health

Access to Document

10.1093/oxfordjournals.rpd.a082770

Cite this

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