TY - BOOK
T1 - Die direkte Messung von Stapelfehlerenergien
AU - Siems, R.
AU - Delavignette, Pierre
AU - Amelinckx, Severin
PY - 1961/7
Y1 - 1961/7
N2 - Different methods for determining stacking fault energies from dislocation configurations observed in the electron microscope are discussed. Configurations discussed are simple, threefold, and fourfold ribbons, arrays of many parallel ribbons, and dislocation nodes. The latter are treated taking the mutual interaction of the partials approximately into account. Results are given for measurements in graphite, MoS2, AIN, and talc.
AB - Different methods for determining stacking fault energies from dislocation configurations observed in the electron microscope are discussed. Configurations discussed are simple, threefold, and fourfold ribbons, arrays of many parallel ribbons, and dislocation nodes. The latter are treated taking the mutual interaction of the partials approximately into account. Results are given for measurements in graphite, MoS2, AIN, and talc.
UR - https://ecm.sckcen.be/OTCS/llisapi.dll/overview/39065948
M3 - BLG - Open report
T3 - SCK CEN Reports
BT - Die direkte Messung von Stapelfehlerenergien
PB - SCK CEN
ER -