Abstract
Different methods for determining stacking fault energies from dislocation configurations observed in the electron microscope are discussed. Configurations discussed are simple, threefold, and fourfold ribbons, arrays of many parallel ribbons, and dislocation nodes. The latter are treated taking the mutual interaction of the partials approximately into account. Results are given for measurements in graphite, MoS2, AlN, and talc.
Original language | German |
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Pages (from-to) | 502-532 |
Number of pages | 31 |
Journal | Zeitschrift für Physik |
Volume | 165 |
Issue number | 5 |
DOIs | |
State | Published - Oct 1961 |
ASJC Scopus subject areas
- Nuclear and High Energy Physics
- General Physics and Astronomy