TY - JOUR
T1 - Dimple optimization for XPS characterization of TEXTOR tile depositions
AU - Uytdenhouwen, Inge
AU - Gonzalez de Vicente, Sehila Maria
AU - Coad, J.P.
AU - Van Renterghem, Wouter
AU - Van den Berghe, Sven
AU - Van Oost, Guido
AU - Massaut, Vincent
A2 - Chaouadi, Rachid
N1 - Score = 10
PY - 2009/6
Y1 - 2009/6
N2 - The plasma wall-interaction in ITER is facing several challenges including surface erosion, material redeposition and tritium retention. In order to assess some of the possible issues, samples from TEXTOR (Forschungszentrum Jülich Tokamak, Germany) have been studied in this work. A smooth gradient in the form of a dimple should be established to enlarge the view of the depositions in depth before analyzing them with X-ray photoelectron spectroscopy (XPS). The dimple depth was optimized in order to cover the deposition thickness. Profilometer measurements with a confocal microscope were carried out to retrieve information on the profile and to ensure the optimum size/form of the dimples. Scanning electron microscopy measurements were carried out with a JSM 6310 microscope in order to obtain the morphology of the dimple area to verify if the deposition was not put under stress. The chemical composition and distribution of the elements along the dimples and on the surface of the samples was detected with an energy dispersive X-ray spectroscopy (EDS).
AB - The plasma wall-interaction in ITER is facing several challenges including surface erosion, material redeposition and tritium retention. In order to assess some of the possible issues, samples from TEXTOR (Forschungszentrum Jülich Tokamak, Germany) have been studied in this work. A smooth gradient in the form of a dimple should be established to enlarge the view of the depositions in depth before analyzing them with X-ray photoelectron spectroscopy (XPS). The dimple depth was optimized in order to cover the deposition thickness. Profilometer measurements with a confocal microscope were carried out to retrieve information on the profile and to ensure the optimum size/form of the dimples. Scanning electron microscopy measurements were carried out with a JSM 6310 microscope in order to obtain the morphology of the dimple area to verify if the deposition was not put under stress. The chemical composition and distribution of the elements along the dimples and on the surface of the samples was detected with an energy dispersive X-ray spectroscopy (EDS).
KW - fusion
KW - graphite
KW - TEXTOR
KW - XPS
UR - http://ecm.sckcen.be/OTCS/llisapi.dll/open/ezp_98661
UR - http://knowledgecentre.sckcen.be/so2/bibref/5907
U2 - 10.1016/j.jnucmat.2009.01.268
DO - 10.1016/j.jnucmat.2009.01.268
M3 - Article
SN - 0022-3115
VL - 390-391
SP - 1138
EP - 1141
JO - Journal of Nuclear Materials
JF - Journal of Nuclear Materials
T2 - 18th International Conference on Plasma-Surface Interactions in Controlled Fusion Device
Y2 - 26 May 2008 through 30 May 2008
ER -