Direct observation of the superlattices of Ta2O5 and Nb2O5 in the electron microscope

J. Spyridelis; P. Delavignette; S. Amelinckx

doi:10.1016/0025-5408(67)90049-9

Direct observation of the superlattices of Ta₂O₅ and Nb₂O₅ in the electron microscope

J. Spyridelis, P. Delavignette, S. Amelinckx

Research output › peer-review

Abstract

Thin foils of niobium and tantalum pentoxide, prepared by recrys-tallization of amorphous films, and which have so called shear structures, have been examined by means of transmission electron microscopy. The long spacing observed in these oxides, as well by direct imaging, as by electron diffraction, is found to depend on the mode of preparation; in particular on the ambient during recrystallization.

Original language	English
Pages (from-to)	113-120
Number of pages	8
Journal	Materials Research Bulletin
Volume	2
Issue number	1
DOIs	https://doi.org/10.1016/0025-5408(67)90049-9
State	Published - Jan 1967

ASJC Scopus subject areas

General Materials Science
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

Access to Document

10.1016/0025-5408(67)90049-9

Cite this

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title = "Direct observation of the superlattices of Ta2O5 and Nb2O5 in the electron microscope",

abstract = "Thin foils of niobium and tantalum pentoxide, prepared by recrys-tallization of amorphous films, and which have so called shear structures, have been examined by means of transmission electron microscopy. The long spacing observed in these oxides, as well by direct imaging, as by electron diffraction, is found to depend on the mode of preparation; in particular on the ambient during recrystallization.",

author = "J. Spyridelis and P. Delavignette and S. Amelinckx",

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AB - Thin foils of niobium and tantalum pentoxide, prepared by recrys-tallization of amorphous films, and which have so called shear structures, have been examined by means of transmission electron microscopy. The long spacing observed in these oxides, as well by direct imaging, as by electron diffraction, is found to depend on the mode of preparation; in particular on the ambient during recrystallization.

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