Abstract
A survey is given of the work done on layer structures using transmission electron microscopy. It is first shown which information can be gained by means of this method. In particular, a description is given of methods to determine Burgers vectors and to measure stacking fault energies from geometrical configurations.
Original language | English |
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Publisher | SCK CEN |
Number of pages | 65 |
State | Published - Mar 1961 |
Publication series
Name | SCK•CEN Reports |
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Publisher | Studiecentrum voor Kernenergie |
No. | BLG-122 |