Abstract
The diffraction contrast at micro-twins, observed by transmission electron microscopy, is discussed on the basis of the dynamic theory and including anomalous absorption. The diffraction conditions and geometrical properties are analyzed, and their effect on the image deduced. The contrast at overlapping twins is discussed in the case where matrix crystal parts are in reflection position. It is shown that a fringe pattern having similar properties to stacking fault patterns
may be observed. The analysis does, however, establish criteria which
distinguish this image from one due to a stacking fault.
may be observed. The analysis does, however, establish criteria which
distinguish this image from one due to a stacking fault.
Original language | English |
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Publisher | SCK CEN |
Number of pages | 24 |
State | Published - Jan 1965 |
Publication series
Name | SCK CEN Reports |
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Publisher | SCK CEN |
No. | BLG-346-PART-I |