In-situ measurements during gamma radiation up to 100 kGy of 0.13μm SiGe NPNs featuring airgap deep trench isolation is compared with NPNs using junction isolation. The devices without this deep trench isolation show a higher degradation during irradiation as well in forward mode as in reverse mode operation. The deep trench isolation can prevent the migration of hydrogen towards the emitter-base oxide resulting in lower degradation. In forward mode operation, the base current density shows a clear saturation with total dose. The onset of this saturation starts at 20 kGy. In reverse mode operation no such saturation was observed. A different impact of radiation-induced donor and acceptor traps on the degradation of the base current density could account for this behavior.
|Title of host publication||RADECS 2008 Workshop - Proceedings of the 8th European Workshop on Radiation Effects on Components and Systems|
|Place of Publication||Jyväskylä, Finland|
|State||Published - 12 Sep 2008|
|Event||RADECS 2008 Workshop - Jyväskylä|
Duration: 10 Sep 2008 → 12 Sep 2008
|Conference||RADECS 2008 Workshop|
|Period||2008-09-10 → 2008-09-12|