Abstract
Infrared Faraday-rotation of n-type silicon at room temperature was measured by a double-beam technique for four doping levels. Free-carrier concentration was determined by means of Hall-effect measurements. For several reasons, a Hall-factor r = 1 was assumed. Differences in effective masses, obtained for different crystals, cannot fully be explained by measurement errors. The impurity concentration gradient along the radius of the crystal must be invoked.
| Original language | English |
|---|---|
| Pages (from-to) | 14-17 |
| Number of pages | 4 |
| Journal | Physica B+C |
| Volume | 89 |
| Issue number | C |
| DOIs | |
| State | Published - Apr 1977 |
ASJC Scopus subject areas
- General Engineering