Grain boundary orientation determination in transmission electron microscopy

P. Delavignette; Th Karakostas; G. Nouet; Frits W. Schapink

doi:10.1002/pssa.2211070209

Grain boundary orientation determination in transmission electron microscopy

P. Delavignette, Th Karakostas, G. Nouet, Frits W. Schapink

Research output › peer-review

Abstract

A method developed for the characterization of grain boundaries employing TEM is described. The need for precise crystal orientation determinations is emphasized; interpretation of the data with the help of coincidence lattice orientation relationships is very useful. The method is applied to grain boundaries in both cubic and hexagonal crystals.

Original language	English
Pages (from-to)	551-558
Number of pages	8
Journal	physica status solidi (a)
Volume	107
Issue number	2
DOIs	https://doi.org/10.1002/pssa.2211070209
State	Published - 16 Jun 1988
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

Access to Document

10.1002/pssa.2211070209

Cite this

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title = "Grain boundary orientation determination in transmission electron microscopy",

abstract = "A method developed for the characterization of grain boundaries employing TEM is described. The need for precise crystal orientation determinations is emphasized; interpretation of the data with the help of coincidence lattice orientation relationships is very useful. The method is applied to grain boundaries in both cubic and hexagonal crystals.",

author = "P. Delavignette and Th Karakostas and G. Nouet and Schapink, {Frits W.}",

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