High‐resolution electron microscopic and electron diffraction study of non‐stoichiometric phases in Cu3—xTe2

D. Colaitis, D. van Dyck, P. Delavignette, S. Amelinckx

    Research outputpeer-review

    Abstract

    The electron diffraction patterns of Cu3—xTe2 are characterized by the occurrence of “incommensurate” superlattice reflections of which the positions with respect to the “basic” reflection, shift in a systematic manner with composition and/or degree of order. Similar effects were described previously with reference to Ni3±xTe2. Such diffraction patterns are interpreted in terms of “shear structures” derived from a simple hypothetical reference phase, for which a structure could be proposed. The incommensurability results from the occurrence of a mixture of spacings between shear planes. The model is consistent with high‐resolution images. Optical diffraction experiments from two‐dimensional gratings representing the structure also support the models.

    Original languageEnglish
    Pages (from-to)271-288
    Number of pages18
    Journalphysica status solidi (a)
    Volume58
    Issue number1
    DOIs
    StatePublished - 16 Mar 1980

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics

    Cite this