Intensity profiles for fringe patterns due to planar interfaces as observed by electron microsocpy

Rudolf Gevers, Joseph Van Landuyt, Severin Amelinckx

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    Fringe profiles occuring at planar interfaces are discussed on the basis of a new simple theory. The theory can be used to derive the contrast at stackïng faults or antiphase boundaries (Ct-boundaries), coherent domain walls (δ-boundaries), and at coherent interfaces cf a mixed nature ( (α-δ )-boundaries), Explicit expressions for the transmitted intensity IT and the scattered intensity IS are derived from the dynamic two-beam theory for electron diffraction, taking anomalous absorption into accounts. The effect of the various physical parameters involved is analysed on the basis of these expressions. Very fine image details can be explained or predicted, which lead to identification
    of the physical origin of the observed contrast features, and enable the sign of α to be determined. The analysis is supported by computed profllas, and a particular case is discussed for which the present method is applicable.
    Original languageEnglish
    PublisherSCK CEN
    Number of pages24
    StatePublished - Jul 1965

    Publication series

    NameSCK CEN Reports
    PublisherSCK CEN

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