Microdosimetric modeling of the relative luminescence efficiency of LiF:Mg,Ti (MTS) detectors exposed to charged particles

Alessio Parisi; Olivier Van Hoey; Filip Vanhavere

doi:10.1093/rpd/ncx188

Microdosimetric modeling of the relative luminescence efficiency of LiF:Mg,Ti (MTS) detectors exposed to charged particles

Alessio Parisi, Olivier Van Hoey, Filip Vanhavere

Research in Dosimetric Applications

Research output › peer-review

Abstract

A microdosimetric model has been developed to predict the relative efficiency of luminescent detectors for measuring different radiation qualities. The model has been tested for LiF:Mg,Ti (MTS) detectors exposed to charged particles from 1 H to 132 Xe in the energy range 3–1000 MeV/u. The obtained results have been compared with experimental data present in literature showing very good agreement in case of calculations performed in a site size of 40 nm.

Original language	English
Title of host publication	Journal: Radiation Protection Dosimetry
Publisher	Oxford University Press
Pages	192-195
Number of pages	4
Volume	180
DOIs	https://doi.org/10.1093/rpd/ncx188
State	Published - Aug 2018

Access to Document

10.1093/rpd/ncx188

Cite this

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title = "Microdosimetric modeling of the relative luminescence efficiency of LiF:Mg,Ti (MTS) detectors exposed to charged particles",

abstract = "A microdosimetric model has been developed to predict the relative efficiency of luminescent detectors for measuring different radiation qualities. The model has been tested for LiF:Mg,Ti (MTS) detectors exposed to charged particles from 1 H to 132 Xe in the energy range 3–1000 MeV/u. The obtained results have been compared with experimental data present in literature showing very good agreement in case of calculations performed in a site size of 40 nm.",

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AU - Vanhavere, Filip

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N2 - A microdosimetric model has been developed to predict the relative efficiency of luminescent detectors for measuring different radiation qualities. The model has been tested for LiF:Mg,Ti (MTS) detectors exposed to charged particles from 1 H to 132 Xe in the energy range 3–1000 MeV/u. The obtained results have been compared with experimental data present in literature showing very good agreement in case of calculations performed in a site size of 40 nm.

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