Mid-to-high-Z precision x-ray measurements

E. G. Kessler, R. D. Deslattes, D. Girard, W. Schwitz, L. Jacobs, O. Renner

Research outputpeer-review

Abstract

New x-ray wavelength (energy) and width measurements are reported for a number of elements from 47Z92. The x rays were produced with the use of an electron Van de Graaff, and the measurements were made with a two-axis flat-crystal transmission spectrometer equipped with angle-measuring interferometers. The new measurements reported here, combined with other high-precision x-ray wavelengths, form a moderately extensive data base for comparison with theoretical calculations. Comparison with recent revisions of a previously available all-Z calculation reveals improved patterns of general agreement with, however, important exceptions. The newly measured linewidths are in agreement with widths calculated via relativistic wave functions used for the term estimates.

Original languageEnglish
Pages (from-to)2696-2706
Number of pages11
JournalPhysical Review A
Volume26
Issue number5
DOIs
StatePublished - 1982
Externally publishedYes

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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