Abstract
Silicon carbide (SiC) radiation detectors were realized by 10B implantation into the metal contact in order to avoid implantation-related defects within the sensitive area of the 4H-SiC pn junction. No post implantation annealing was performed. Such detectors respond to thermal neutrons showing consistent counting rates as function of external reverse bias voltages and radiation intensity.
| Original language | English |
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| Title of host publication | Materials Science Forum Vols. 778-780, doi:10.4028/www.scientific.net/MSF.778-780.1046 |
| Place of Publication | Zürich, Switzerland |
| Pages | 1046-1049 |
| State | Published - Feb 2014 |
| Event | International Conference on Silicon Carbide and Related Materials 2013 (ICSCRM2013) - JAEA, AIST, CRIEPI, Miyazaki Duration: 29 Sep 2013 → 4 Oct 2013 |
Conference
| Conference | International Conference on Silicon Carbide and Related Materials 2013 (ICSCRM2013) |
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| Country/Territory | Japan |
| City | Miyazaki |
| Period | 2013-09-29 → 2013-10-04 |