On the diffraction features of two‐layer systems. Application to Ni3±xTe2

D. van Dyck; D. Colaïtis; P. Delavignette; S. Amelinckx

doi:10.1002/pssa.2210530109

On the diffraction features of two‐layer systems. Application to Ni_3±xTe₂

D. van Dyck
, D. Colaïtis
, P. Delavignette
, S. Amelinckx

Research output › peer-review

Abstract

The ordering process of some two‐layer systems such as Ni_3±xTe₂ is characterised by the appearance of a small number of quasi‐incommensurable superlattice reflections, of which the positions shift continuously with composition. Although for each system, a structural model can be derived by trial and error procedures, it is the purpose of this work to explain such characteristic diffraction features more systematically in terms of a shear‐structure like model. The results are applied to confirm the previously derived structures for the ordered phases in Ni_3±xTe₂.

Original language	English
Pages (from-to)	105-112
Number of pages	8
Journal	Physica Status Solidi (A) Applied Research
Volume	53
Issue number	1
DOIs	https://doi.org/10.1002/pssa.2210530109
State	Published - 16 May 1979

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

Access to Document

10.1002/pssa.2210530109

Cite this

@article{6ec9c28de5a543b48002b0d957a2af2c,

title = "On the diffraction features of two‐layer systems. Application to Ni3±xTe2",

abstract = "The ordering process of some two‐layer systems such as Ni3±xTe2 is characterised by the appearance of a small number of quasi‐incommensurable superlattice reflections, of which the positions shift continuously with composition. Although for each system, a structural model can be derived by trial and error procedures, it is the purpose of this work to explain such characteristic diffraction features more systematically in terms of a shear‐structure like model. The results are applied to confirm the previously derived structures for the ordered phases in Ni3±xTe2.",

author = "\{van Dyck\}, D. and D. Cola{\"i}tis and P. Delavignette and S. Amelinckx",

year = "1979",

month = may,

day = "16",

doi = "10.1002/pssa.2210530109",

language = "English",

volume = "53",

pages = "105--112",

number = "1",

}

TY - JOUR

T1 - On the diffraction features of two‐layer systems. Application to Ni3±xTe2

AU - van Dyck, D.

AU - Colaïtis, D.

AU - Delavignette, P.

AU - Amelinckx, S.

PY - 1979/5/16

Y1 - 1979/5/16

N2 - The ordering process of some two‐layer systems such as Ni3±xTe2 is characterised by the appearance of a small number of quasi‐incommensurable superlattice reflections, of which the positions shift continuously with composition. Although for each system, a structural model can be derived by trial and error procedures, it is the purpose of this work to explain such characteristic diffraction features more systematically in terms of a shear‐structure like model. The results are applied to confirm the previously derived structures for the ordered phases in Ni3±xTe2.

AB - The ordering process of some two‐layer systems such as Ni3±xTe2 is characterised by the appearance of a small number of quasi‐incommensurable superlattice reflections, of which the positions shift continuously with composition. Although for each system, a structural model can be derived by trial and error procedures, it is the purpose of this work to explain such characteristic diffraction features more systematically in terms of a shear‐structure like model. The results are applied to confirm the previously derived structures for the ordered phases in Ni3±xTe2.

UR - https://www.scopus.com/pages/publications/0018466818

U2 - 10.1002/pssa.2210530109

DO - 10.1002/pssa.2210530109

M3 - Article

AN - SCOPUS:0018466818

SN - 0031-8965

VL - 53

SP - 105

EP - 112

JO - Physica Status Solidi (A) Applied Research

JF - Physica Status Solidi (A) Applied Research

IS - 1

ER -