On the OSL curve shape and preheat treatment of electronic components from portable electronic devices

Clemens Woda, Steffen Greilich, Koen Beerten

    Research outputpeer-review


    The OSL decay curve of alumina-rich components from personal objects and the preheat treatment is investigated. An early observation showed that the dose increases with increasing OSL integration time. It is shown that this is caused by an unresolved low temperature TL peak (140°C) contributing to the OSL, but with a lower thermal stability than the main contributing TL peak at 190°C.
    Original languageEnglish
    Pages (from-to)746-748
    JournalRadiation Measurements
    Issue number3-6
    StatePublished - Mar 2010
    Event7th International Conference on Luminescent Detectors and Transformers of Ionizing Radiation LUMDETR 2009 - Institute of Physics, Krakow, Krakow
    Duration: 12 Jul 200912 Jul 2009

    Cite this