@inproceedings{a9ae9f2ffbc84e2aad87bcaef9df35a3,
title = "Radiation effects in future electronics from device to systems: Roundtable report",
abstract = "Considering the technology trends of future electronics, panelists have reviewed some of the most demanding applications. These sectors were successively, the new nuclear physics facilities, for Knowledge and for Energy, and the vital issue of reliability of Avionics systems.",
keywords = "Harsh environment, Nanoelectronics, Radiation effects",
author = "Olivier Flament and Benoit Brichard and Andrew Chugg and Clive Dyer and Robert Edwards and Eishi Ibe and Ron Lacoe and Alessandro Paccagnella and Andrew Holmes-Siedle and Leray, {Jean Luc}",
year = "2007",
doi = "10.1109/RADECS.2007.5205427",
language = "English",
isbn = "9781424417049",
series = "Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "26--30",
booktitle = "2007 9th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2007",
address = "United States",
note = "RADECS - 2007 : 9th European Conference on Radiation and Its Effects on Components and Systems ; Conference date: 10-09-2007 Through 14-09-2007",
}