Abstract
Radiation detectors based on radiation-hardened
semiconductor such as silicon carbide, have received considerable
attention in many applications such as in outer space, high
energy physics experiments, gas and oil prospection, and nuclear
reactors. In the frame work of the European project I_SMART we
demonstrated for the first time the reliability of thermal neutron
detectors realized by standard ion implantation of boron atoms
to form a neutron converter layer (NCL). Two types of detectors
were realized; the first was implanted by aluminum to create the
p+ layer, and then implanted by boron ( 10B) to realize the
NCL. The second type was based on p+ epitaxial layer, and was
implanted by 10B into the aluminum metallic contact in order
to avoid implantation-related defect within the sensitive area.
Both kinds of detectors reveal to respond to thermal neutrons and
gamma rays, showing consistent counting rates as a function of
bias voltages, radiation intensity and type of shielding.
Original language | English |
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Pages (from-to) | 2105-2111 |
Journal | IEEE transactions on nuclear Science |
Volume | 61 |
Issue number | 4 |
DOIs | |
State | Published - Aug 2014 |