Sensitivity of TCS correction factors to uncertainty in efficiency values

Tim Vidmar

Sensitivity of TCS correction factors to uncertainty in efficiency values

Research output › peer-review

Abstract

True coincidence summing (TCS) corrections are increasingly being calculated rather than measured. According to the established standards the uncertainty of the calculated TCS correction values has to be estimated. We carried out a systematic study of the uncertainty of the TCS correction factors resulting from uncertainty in the input efficiencies for a large number of radionuclides and we find that the relative uncertainty of the TCS correction factors is in general proportional to the value of the correction factor itself.

Original language	English
Title of host publication	ICRM Technical Series on Radionuclide Metrology
Subtitle of host publication	Proceedings of the 22ndInternational Conference on Radionuclide Metrology and its Applications (ICRM 2019), 27-31May 2019
Editors	Uwe Wätjen, Begoña Quinatana Arnés, Eduardo Garciá-Toraño
Place of Publication	Salamanca, Spain
Publisher	International Committee for Radionuclide Metrology
Pages	26-28
Number of pages	3
State	Published - 1 Jan 2020
Event	2019 - ICRM: 22nd International Conference on Radionuclide Metrology and its Applications - University of Salamanca, Salamanca Duration: 15 May 2019 → 19 May 2019

Publication series

Name	ICRM technical series on radionuclide metrology
Publisher	International Committee for Radionuclide Metrology
Volume	2
ISSN (Print)	2522-4328

Conference

Conference	2019 - ICRM
Country/Territory	Spain
City	Salamanca
Period	2019-05-15 → 2019-05-19

Access to Document

https://physics.nist.gov/ICRM/ICRM_technicalseries_2.pdfLicense: Unspecified

Cite this

Vidmar, T. (2020). Sensitivity of TCS correction factors to uncertainty in efficiency values. In U. Wätjen, B. Quinatana Arnés, & E. Garciá-Toraño (Eds.), ICRM Technical Series on Radionuclide Metrology: Proceedings of the 22ndInternational Conference on Radionuclide Metrology and its Applications (ICRM 2019), 27-31May 2019 (pp. 26-28). (ICRM technical series on radionuclide metrology; Vol. 2). International Committee for Radionuclide Metrology. https://physics.nist.gov/ICRM/ICRM_technicalseries_2.pdf

Vidmar, Tim. / Sensitivity of TCS correction factors to uncertainty in efficiency values. ICRM Technical Series on Radionuclide Metrology: Proceedings of the 22ndInternational Conference on Radionuclide Metrology and its Applications (ICRM 2019), 27-31May 2019. editor / Uwe Wätjen ; Begoña Quinatana Arnés ; Eduardo Garciá-Toraño. Salamanca, Spain : International Committee for Radionuclide Metrology, 2020. pp. 26-28 (ICRM technical series on radionuclide metrology).

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title = "Sensitivity of TCS correction factors to uncertainty in efficiency values",

abstract = "True coincidence summing (TCS) corrections are increasingly being calculated rather than measured. According to the established standards the uncertainty of the calculated TCS correction values has to be estimated. We carried out a systematic study of the uncertainty of the TCS correction factors resulting from uncertainty in the input efficiencies for a large number of radionuclides and we find that the relative uncertainty of the TCS correction factors is in general proportional to the value of the correction factor itself.",

keywords = "Gamma-ray spectrometry, True coincidence summing corrections, Calculation, Uncertainty",

author = "Tim Vidmar",

note = "Score=3; 2019 - ICRM : 22nd International Conference on Radionuclide Metrology and its Applications ; Conference date: 15-05-2019 Through 19-05-2019",

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Vidmar, T 2020, Sensitivity of TCS correction factors to uncertainty in efficiency values. in U Wätjen, B Quinatana Arnés & E Garciá-Toraño (eds), ICRM Technical Series on Radionuclide Metrology: Proceedings of the 22ndInternational Conference on Radionuclide Metrology and its Applications (ICRM 2019), 27-31May 2019. ICRM technical series on radionuclide metrology, vol. 2, International Committee for Radionuclide Metrology, Salamanca, Spain, pp. 26-28, 2019 - ICRM, Salamanca, Spain, 2019-05-15. <https://physics.nist.gov/ICRM/ICRM_technicalseries_2.pdf>

Sensitivity of TCS correction factors to uncertainty in efficiency values. / Vidmar, Tim.
ICRM Technical Series on Radionuclide Metrology: Proceedings of the 22ndInternational Conference on Radionuclide Metrology and its Applications (ICRM 2019), 27-31May 2019. ed. / Uwe Wätjen; Begoña Quinatana Arnés; Eduardo Garciá-Toraño. Salamanca, Spain: International Committee for Radionuclide Metrology, 2020. p. 26-28 (ICRM technical series on radionuclide metrology; Vol. 2).

Research output › peer-review

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N2 - True coincidence summing (TCS) corrections are increasingly being calculated rather than measured. According to the established standards the uncertainty of the calculated TCS correction values has to be estimated. We carried out a systematic study of the uncertainty of the TCS correction factors resulting from uncertainty in the input efficiencies for a large number of radionuclides and we find that the relative uncertainty of the TCS correction factors is in general proportional to the value of the correction factor itself.

AB - True coincidence summing (TCS) corrections are increasingly being calculated rather than measured. According to the established standards the uncertainty of the calculated TCS correction values has to be estimated. We carried out a systematic study of the uncertainty of the TCS correction factors resulting from uncertainty in the input efficiencies for a large number of radionuclides and we find that the relative uncertainty of the TCS correction factors is in general proportional to the value of the correction factor itself.

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KW - Uncertainty

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BT - ICRM Technical Series on Radionuclide Metrology

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Vidmar T. Sensitivity of TCS correction factors to uncertainty in efficiency values. In Wätjen U, Quinatana Arnés B, Garciá-Toraño E, editors, ICRM Technical Series on Radionuclide Metrology: Proceedings of the 22ndInternational Conference on Radionuclide Metrology and its Applications (ICRM 2019), 27-31May 2019. Salamanca, Spain: International Committee for Radionuclide Metrology. 2020. p. 26-28. (ICRM technical series on radionuclide metrology).