Temperature sensitivity in birefringent photonic crystal fiber with triple defect

Tadeusz Martynkien, Marcin Szpulak, Maciej Kieryk, Gabriela Statkiewicz, Jacek Olszewski, Waclaw Urbanczyk, Jan Wojcik, Pawel Mergo, Mariusz Makara, Tomasz Nasilowski, Francis Berghmans, Hugo Thienpont

    Research outputpeer-review

    Abstract

    We measured and calculated the spectral dependence of the polarimetric sensitivity to temperature (dB/dT) in a photonic crystal holey fiber. The birefringence in this fiber is induced by the elliptical shape of the core, which consists of a triple defect in the hexagonal structure. Comparison of the temperature sensitivity measured for the bare fiber and for the fiber with polymer coating shows that the stress induced by the thermal expansion of the polymer contributes significantly to the overall temperature response. Measurements carried out for the bare fiber demonstrate that the temperature sensitivity has a positive sign and strongly increases vs. wavelength. Additionally, we present the results of calculations of the spectral dependence of dB/dT obtained using a finite element method. The calculated and measured values of dB/dT show relatively good agreement.

    Original languageEnglish
    Title of host publication17th International Conference on Optical Fibre Sensors
    Pages912-915
    Number of pages4
    Volume5855 PART II
    DOIs
    StatePublished - 2005
    Event2005 - SPIE: Conference on Optical Fibre Sensors - Oud St-Jan Art and Congress Centre, Bruges
    Duration: 23 May 200527 May 2005

    Publication series

    NameProceedings of SPIE - The International Society for Optical Engineering
    PublisherSPIE - Society of Photo-optical Instrumentation Engineers
    ISSN (Print)0277-786X

    Conference

    Conference2005 - SPIE
    Country/TerritoryBelgium
    CityBruges
    Period2005-05-232005-05-27

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics
    • Computer Science Applications
    • Applied Mathematics
    • Electrical and Electronic Engineering

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