Topical Report on the fitting of SIMS profiles of glasses SON68 and SM539 altered in wet clay or Compact Boom Clay

Marc Aertsens, Zhang Hua, Karel Lemmens, Pierre Van Iseghem

Research outputpeer-review

Abstract

This report presents, summarizes and discusses the results obtained by fitting with the model Fit_sims SIMS element profiles (boron, lithium, sodium and hydrogen) of glasses SON68 and SM539 altered in Wet Clay or Compactg Boom Clay. Due to the large difference in measured profiles between measurements at different sites of the same glass, it is hard to draw significant conclusions about layer thicknesses or diffusion coefficients. In Wet Clay, the dissolved thickness based on boron is smaller than the dissolved thickness based on mass loss, indicating sorption of boron on the clay.
Original languageEnglish
PublisherSCK CEN
Number of pages22
Volume1
Edition0
StatePublished - Oct 2010

Publication series

NameSCK•CEN Reports
PublisherStudiecentrum voor Kernenergie
No.ER-144

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