Trends in the valence band electronic structures of mixed uranium oxides

Kristina Kvashnina, P.M. Kowalski, S.M. Butorin, Gregory Leinders, Janne Pakarinen, Rene Bes, H. Li, Marc Verwerft

    Research outputpeer-review


    Valence band electronic structure of mixed uranium oxides (UO2, U4O9, U3O7, U3O8, -UO3) has been studied by the resonant inelastic X-ray scattering (RIXS) technique at the U M5 edge and the computational methods. We show here that the RIXS technique and recorded U 5f - O 2p charge transfer excitations can be used to proof the validity of theoretical aproximations.
    Original languageEnglish
    Number of pages4
    JournalChemical Communications
    StatePublished - 8 Aug 2018

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