SIMS (secondary ion mass spectroscopy) measurements have been performed on samples of glasses leached in synthetic interstitial clay water (SIC). The purpose of these measurements is trying to retrieve from the element profiles diffusion coefficients, which could be used to predict or help better understand glass dissolution rates in SIC.
In the present report, we first present (in chapter two) a model which can be used to fit diffusion coefficients from SIMS profiles. In chapter three, we briefly explain how data are obtained by SIMS as well as the problems related to the interpretation of the measured profiles (which are added in annex). The results of fitting the data with the model are presented in chapter four. A discussion of the results follows in chapter five. Chapter six contains the conclusions.
The model used in this report was developed in the period 2000-2003 (research plan RP.WD.008). The model was used to fit SIMS profiles obtained on glass samples in clay waters in the programme 1996-2000. The report has been formalized, with internal SCK.CEN review, in the first semester of 2009, and can be considered as output of WP7 of RP.W&D.0061 (work package related to glass dissolution in clay conditions)
|Number of pages
|Published - Mar 2009
|Studiecentrum voor Kernenergie