X-ray photoelectron spectroscopy on uranium oxides: A comparison between bulk and thin layers

S. Van Den Berghe; Frédéric Miserque; T. Gouder; B. Gaudreau; M. Verwerft

doi:10.1016/S0022-3115(01)00461-5

X-ray photoelectron spectroscopy on uranium oxides: A comparison between bulk and thin layers

S. Van Den Berghe, Frédéric Miserque, T. Gouder, B. Gaudreau, M. Verwerft

Research output › peer-review

Abstract

The use of sputter deposited thin layers of UO₂ as a model system for the investigation of fuel-fission product interactions is presented. The representativity of the layers for the bulk system will be validated and it will be shown, both on theoretical and experimental grounds, that layers of stoichiometric UO₂ can be produced by this method. A comparison will be made between X-ray photoelectron spectroscopic (XPS) results on bulk UO₂ and on the deposited layers. The films deposited can easily be doped with other elements, such as fission products, by codepositing these elements with the UO₂. This codeposition technique has subsequently been used to produce layers of UO₂ containing cesium. It will be demonstrated that the codeposition with cesium produces uranium in higher valence states (up to U^VI), while without cesium, no higher uranium valencies can be obtained.

Original language	English
Pages (from-to)	168-174
Number of pages	7
Journal	Journal of Nuclear Materials
Volume	294
Issue number	1-2
DOIs	https://doi.org/10.1016/S0022-3115(01)00461-5
State	Published - Apr 2001

ASJC Scopus subject areas

Nuclear and High Energy Physics
General Materials Science
Nuclear Energy and Engineering

Access to Document

10.1016/S0022-3115(01)00461-5

Cite this

@article{009fa42fab3d417fba07c69457eaf3e1,

title = "X-ray photoelectron spectroscopy on uranium oxides: A comparison between bulk and thin layers",

abstract = "The use of sputter deposited thin layers of UO2 as a model system for the investigation of fuel-fission product interactions is presented. The representativity of the layers for the bulk system will be validated and it will be shown, both on theoretical and experimental grounds, that layers of stoichiometric UO2 can be produced by this method. A comparison will be made between X-ray photoelectron spectroscopic (XPS) results on bulk UO2 and on the deposited layers. The films deposited can easily be doped with other elements, such as fission products, by codepositing these elements with the UO2. This codeposition technique has subsequently been used to produce layers of UO2 containing cesium. It will be demonstrated that the codeposition with cesium produces uranium in higher valence states (up to UVI), while without cesium, no higher uranium valencies can be obtained.",

author = "{Van Den Berghe}, S. and Fr{\'e}d{\'e}ric Miserque and T. Gouder and B. Gaudreau and M. Verwerft",

year = "2001",

month = apr,

doi = "10.1016/S0022-3115(01)00461-5",

language = "English",

volume = "294",

pages = "168--174",

journal = "Journal of Nuclear Materials",

issn = "0022-3115",

publisher = "Elsevier",

number = "1-2",

}

TY - JOUR

T1 - X-ray photoelectron spectroscopy on uranium oxides

T2 - A comparison between bulk and thin layers

AU - Van Den Berghe, S.

AU - Miserque, Frédéric

AU - Gouder, T.

AU - Gaudreau, B.

AU - Verwerft, M.

PY - 2001/4

Y1 - 2001/4

N2 - The use of sputter deposited thin layers of UO2 as a model system for the investigation of fuel-fission product interactions is presented. The representativity of the layers for the bulk system will be validated and it will be shown, both on theoretical and experimental grounds, that layers of stoichiometric UO2 can be produced by this method. A comparison will be made between X-ray photoelectron spectroscopic (XPS) results on bulk UO2 and on the deposited layers. The films deposited can easily be doped with other elements, such as fission products, by codepositing these elements with the UO2. This codeposition technique has subsequently been used to produce layers of UO2 containing cesium. It will be demonstrated that the codeposition with cesium produces uranium in higher valence states (up to UVI), while without cesium, no higher uranium valencies can be obtained.

AB - The use of sputter deposited thin layers of UO2 as a model system for the investigation of fuel-fission product interactions is presented. The representativity of the layers for the bulk system will be validated and it will be shown, both on theoretical and experimental grounds, that layers of stoichiometric UO2 can be produced by this method. A comparison will be made between X-ray photoelectron spectroscopic (XPS) results on bulk UO2 and on the deposited layers. The films deposited can easily be doped with other elements, such as fission products, by codepositing these elements with the UO2. This codeposition technique has subsequently been used to produce layers of UO2 containing cesium. It will be demonstrated that the codeposition with cesium produces uranium in higher valence states (up to UVI), while without cesium, no higher uranium valencies can be obtained.

UR - http://www.scopus.com/inward/record.url?scp=0035309790&partnerID=8YFLogxK

U2 - 10.1016/S0022-3115(01)00461-5

DO - 10.1016/S0022-3115(01)00461-5

M3 - Article

AN - SCOPUS:0035309790

SN - 0022-3115

VL - 294

SP - 168

EP - 174

JO - Journal of Nuclear Materials

JF - Journal of Nuclear Materials

IS - 1-2

ER -